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Enhanced On-Wafer VNA Measurements From 70 kHz To 220 GHz In A Single Sweep

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  • Enhanced On-Wafer VNA Measurements From 70 kHz To 220 GHz In A Single Sweep
Steve Reyes

Event Date: Wednesday, September 2, 2020
Event Time: 8:00 PM CEST | 2:00 PM ET | 11:00 AM PT
Hosted by: Microwaves & RF
Sponsored by: Anritsu

Registration link!

Modern microwave communication systems continue to push on-wafer VNA measurements into the mmWave bands. Successful system design depends on optimum device characterization, generating well-defined device models, resulting in dependable circuit simulation. It has been demonstrated that characterizing devices well beyond 125 GHz dramatically improves device model accuracy, even for applications operating 60 GHz and below. As a result, the current incentive for on-wafer VNA measurements is to provide single-sweep coverage over an extremely wide frequency range to maximize the potential for first-turn design success. This WebTalk will discuss important aspects when performing ultra-wideband 220 GHz VNA measurements and will describe basic VNA architecture, choices in broadband VNA calibrations, and how to optimize VNA on-wafer measurement performance.  

Speaker: Steve Reyes, Sr. Product Manager, Anritsu Company                

Steve Reyes is a Senior Product Manager focusing on on-wafer broadband VNA measurements at Anritsu Company. He has been involved in the sales and marketing of microwave test and measurement equipment for over 35 years primarily focused on VNA solutions. Steve received a BA degree from the University of California, Davis and a M.B.A. degree from Santa Clara University. During this 30-minute WebTalk, he will cover…

Value drivers for 220 GHz on-wafer broadband measurements 

Overview of the system architecture of a broadband VNA system

System design solutions for 220 GHz measurements including the design of a 0.6mm coaxial connection and interface with a 220 GHz probe 

On-wafer calibration techniques, choices and resulting performance